|ITEM METADATA RECORD
|Title: ||Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs|
|Authors: ||Rafi, J.M ×|
Claeys, Corneel #
|Issue Date: ||2006 |
|Series Title: ||Microelectronics Reliability vol:46 issue:09/11/07 pages:1657-1663|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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