Title: Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs
Authors: Rafi, J.M ×
Simoen, Eddy
Hayama, K
Mercha, Abdelkarim
Campabadal, F
Ohyama, H
Claeys, Corneel #
Issue Date: 2006
Series Title: Microelectronics Reliability vol:46 issue:09/11/07 pages:1657-1663
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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