Title: Topside release of atomic force microscopy probes with molded diamond tips
Authors: Fouchier, Marc
Eyben, Pierre
Jamieson, Geraldine
Vandervorst, Wilfried
Issue Date: 2004
Conference: Micro- and Nanoengineering Conference location:Leuven Belgium date:19/09/04
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous

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