|ITEM METADATA RECORD
|Title: ||High resolution electrical characterization of advanced CMOS devices|
|Authors: ||Eyben, Pierre ×|
Vandervorst, Wilfried #
|Issue Date: ||2004 |
|Host Document: ||pages:S4-3-76|
|Conference: ||Seeing at the Nanoscale II location:Leuven Belgium date:13/10/04|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
× corresponding author|
# (joint) last author|
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