Title: High resolution electrical characterization of advanced CMOS devices
Authors: Eyben, Pierre ×
Petry, Jasmine
Janssens, Tom
Fukutome, H
Vandervorst, Wilfried #
Issue Date: 2004
Host Document: pages:S4-3-76
Conference: Seeing at the Nanoscale II location:Leuven Belgium date:13/10/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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