Title: Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current
Authors: Crupi, Felice ×
Iannaccone, G
Crupi, Isodiana
Degraeve, Robin
Groeseneken, Guido
Maes, Herman #
Issue Date: 2001
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE transactions on electron devices vol:48 issue:6 pages:1109-1113
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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