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Title: The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafers
Authors: Rotondaro, Antonio ×
Hurd, Trace
Kaniava, Arvydas
Simoen, Eddy
Heyns, Marc
Claeys, Cor
Brown, G #
Issue Date: 1995
Host Document: pages:54-63
Conference: ALTECH 95: Analytical Techniques for Semiconductor Materials and Process Characterization II. Proceedings of the Satellite Sympo location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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