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|ITEM METADATA RECORD
|Title: ||Defect analysis of n-type silicon strained layers|
|Authors: ||Simoen, Eddy|
Herzog, H. J
|Issue Date: ||2000 |
|Conference: ||International Conference on Electronic Materials & European Materials Research Society Spring Meeting. Symposium M: Advanced Cha location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
Associated Section of ESAT - INSYS, Integrated Systems
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