This item still needs to be validated !
Title: Defect analysis of n-type silicon strained layers
Authors: Simoen, Eddy
Loo, Roger
Roussel, Philippe
Caymax, Matty
Bender, Hugo
Claeys, Cor
Herzog, H. J
Blondeel, A
Clauws, P
Issue Date: 2000
Conference: International Conference on Electronic Materials & European Materials Research Society Spring Meeting. Symposium M: Advanced Cha location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.