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Title: Status of NODITO Project
Authors: Sikula, J ×
Vasina, Petr
Claeys, Cor #
Issue Date: 1995
Host Document: pages:11-18
Conference: Noise and Reliability of Semiconductor Devices. Proceedings of the International NODITO Workshop; 18-20 July 1995; Brno, Czech R
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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