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Title: Correlation between the low-frequency noise spectral density and the static device parameters of silicon-on-insulator MOSFET's
Authors: Simoen, Eddy ×
Claeys, Cor #
Issue Date: 1995
Series Title: IEEE Transactions on Electron Devices vol:42 issue:8 pages:1467-72
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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