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Title: Low-frequency noise diagnostics of CMOS technologies
Authors: Simoen, Eddy ×
Claeys, Cor #
Issue Date: 1995
Host Document: pages:585-588
Conference: Noise in Physical Systems and 1/f Fluctuations - ICNF. Proceedings of the 13th International Conference; May 29 - June 3, 1995 location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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