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Title: Local potential measurements in silicon devices using atomic force microscopy with conductive tips
Authors: Trenkler, Thomas ×
De Wolf, Peter
Snauwaerts, Jan
Qamhieh, Z
Vandervorst, Wilfried
Hellemans, Louis #
Issue Date: 1995
Host Document: pages:477-481
Conference: ESSDERC '95. Proceedings of the 25th European Solid State Device Research Conference; 25-27 Sept. 1995; The hague, The Netherla
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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