Title: Relation between breakdown mode and location in short-channel nMOSFETs and its impact on reliability specifications
Authors: Degraeve, Robin ×
Kaczer, Ben
De Keersgieter, An
Groeseneken, Guido #
Issue Date: 2001
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:1 issue:3 pages:163-169
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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