Title: Analytical model for failure rate prediction due to anomalous charge loss of Flash memories
Authors: Degraeve, Robin ×
Schuler, Franz
Lorenzini, Martino
Wellekens, Dirk
Hendrickx, Paul
Van Houdt, Jan
Haspeslagh, Luc
Groeseneken, Guido
Tempel, Georg #
Issue Date: 2001
Host Document: pages:699-702
Conference: IEDM Technical Digest location:Leuven Belgium date:02/12/01
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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