Title: Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: electrical characterization and modeling
Authors: Houssa, Michel
Aoulaiche, Marc
De Gendt, Stefan
Groeseneken, Guido
Heyns, Marc #
Issue Date: 2006
Conference: International Workshop on Computational Electronics location:Leuven Belgium date:24/05/06
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Molecular Design and Synthesis
Department of Materials Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
# (joint) last author

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