Title: Analysing antenna ratio dependence of plasma charging damage with Weibull breakdown statistics
Authors: Van den bosch, G ×
Creusen, Martin
Degraeve, Robin
Kaczer, Ben
Groeseneken, Guido #
Issue Date: 2000
Host Document: pages:528-531
Conference: Proceedings of the 30th European Solid-State Device Research Conference - ESSDERC 2000; 11-13 September 2000; Cork, Ireland.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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