Title: Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays
Authors: Van Houdt, Jan ×
Wellekens, Dirk
Vanhorebeek, Guido
Haspeslagh, Luc
Deferm, Ludo
Groeseneken, Guido
Maes, Herman #
Issue Date: 1995
Host Document: pages:553-556
Conference: ESSDERC '95. Proceedings of the 25th European Solid State Device Research Conference; 25-27 Sept. 1995; The hague, The Netherla location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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