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Title: Extraction of the minority carrier recombination lifetime from forward diode characteristics
Authors: Vanhellemont, Jan ×
Simoen, Eddy
Claeys, Cor #
Issue Date: 1995
Series Title: Applied Physics Letters vol:66 issue:21 pages:2894-6
ISSN: 0003-6951
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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