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Title: Low frequency noise assessment of hot carrier stress effects in 0.7?m MOSFETs
Authors: Vasina, Petr ×
Simoen, Eddy
Claeys, Cor
Sikula, J #
Issue Date: 1995
Host Document: pages:167-171
Conference: Noise and Reliability of Semiconductor Devices. Proceedings of the International NODITO Workshop; 18-20 July 1995; Brno, Czech R
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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