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Title: Analysis of irradiation induced defects in silicon devices
Authors: Vegh, Gerzson ×
Simoen, Eddy
Vanhellemont, Jan
Claeys, Cor #
Issue Date: 1995
Host Document: pages:329-34
Conference: RELECTRONIC '95. 9th Symposium on Quality and Reliability in Electronics; 16-18 Oct. 1995; Budapest, Hungary. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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