Title: The ESD protection mechanisms and the related failure modes and mechanisms observed in SOI snapback nMOSFET's
Authors: Verhaege, K ×
Groeseneken, Guido
Colinge, Jean-Pierre
Maes, Herman #
Issue Date: 1995
Series Title: Microelectronics Reliability vol:35 issue:3 pages:555-66
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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