Title: NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Authors: Verhaege, K ×
Luchies, J. M
Russ, Christian
Groeseneken, Guido
Kuper, F #
Issue Date: 1995
Host Document: pages:117-125
Conference: Proceedings of the 6th ESREF Conference; 3-6 Oct. 1995; Bordeaux, France.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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