Title: Consistent model for short-channel nMOSFET post-hard-breakdown characteristics
Authors: Kaczer, Ben ×
Degraeve, Robin
De Keersgieter, An
Van de Mieroop, Koen
Bearda, Twan
Groeseneken, Guido #
Issue Date: 2001
Host Document: pages:121-122
Conference: Symposium on VLSI Technology. Digest of Technical Papers; 12-14 June 2001; Kyoto, Japan. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science