|ITEM METADATA RECORD
|Title: ||Impact of oxide breakdown on FET and circuit operation and reliability|
|Authors: ||Kaczer, Ben|
De Keersgieter, An
Van de Mieroop, Koen
|Issue Date: ||2001 |
|Conference: ||SISC-Conference; December 2001; Washington, D.C. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Electrical Engineering - miscellaneous|
ESAT - MICAS, Microelectronics and Sensors
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