Title: Impact of oxide breakdown on FET and circuit operation and reliability
Authors: Kaczer, Ben
Degraeve, Robin
De Keersgieter, An
Van de Mieroop, Koen
Rasras, Mahmoud
Simons, Veerle
Roussel, Philippe
Groeseneken, Guido
Issue Date: 2001
Conference: SISC-Conference; December 2001; Washington, D.C. location:Leuven Belgium
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors

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