Title: Two-dimensional carrier profiling in advanced devices with pico-meter resolution
Authors: Vandervorst, Wilfried ×
Alvarez, David
Eyben, Pierre
Fouchier, Marc
Hartwich, J
Slesazech, S
Verheyen, Peter
Hogg, S #
Issue Date: 2004
Host Document: pages:63-67
Conference: Proceedings Ultimate Integration of Silicon (ULIS) Workshop location:Leuven Belgium date:11/03/04
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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