|ITEM METADATA RECORD
|Title: ||Two-dimensional carrier profiling in advanced devices with pico-meter resolution|
|Authors: ||Vandervorst, Wilfried ×|
Hogg, S #
|Issue Date: ||2004 |
|Host Document: ||pages:63-67|
|Conference: ||Proceedings Ultimate Integration of Silicon (ULIS) Workshop location:Leuven Belgium date:11/03/04|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||Electrical Engineering - miscellaneous|
× corresponding author|
# (joint) last author|
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