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Title: Formalized three-layer system-level reuse model and methodology for embedded data-dominated applications
Authors: VERMEULEN, FREDERIK ×
Catthoor, Francky
Verkest, Diederik
De Man, Hugo #
Issue Date: 2000
Host Document: pages:92-98
Conference: Proceedings Design, Automation and Test in Europe Conference and Exhibition; March 27-30, 2000; Paris, France. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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