Title: Gate induced floating body effects in SiON and HfO2 triple gate SOI FinFETs
Authors: Rafi, J.M
Simoen, Eddy
Mercha, Abdelkarim
Collaert, Nadine
Hayama, K
Campabadal, F
Claeys, Corneel
Issue Date: 2007
Conference: EUROSOI Workshop location:Barcelona Spain date:24/01/07
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems

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