|ITEM METADATA RECORD
|Title: ||Gate induced floating body effects in SiON and HfO2 triple gate SOI FinFETs|
|Authors: ||Rafi, J.M|
|Issue Date: ||2007 |
|Conference: ||EUROSOI Workshop location:Barcelona Spain date:24/01/07|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.