Title: Degradation of oxides and oxynitrides under hot hole stress
Authors: Zhang, Jenny ×
Sii, H. K
Groeseneken, Guido
Degraeve, Robin #
Issue Date: 2000
Series Title: IEEE Transactions on Electron Devices vol:47 issue:2 pages:378-386
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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