ITEM METADATA RECORD
Title: On the hot-hole induced post-stress interface trap generation in MOSFETs
Authors: Al-Kofahi, I. S ×
Zhang, Jenny
Groeseneken, Guido #
Issue Date: 1996
Host Document: pages:305-310
Conference: 1996 International Reliability Physics Proceedings ; April 29 - May 2, 1996. Dallas, Texas, USA.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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