Title: On the hot-hole induced post-stress interface trap generation in MOSFETs
Authors: Al-Kofahi, I. S ×
Zhang, Jenny
Groeseneken, Guido #
Issue Date: 1996
Host Document: pages:305-310
Conference: 1996 International Reliability Physics Proceedings ; April 29 - May 2, 1996. Dallas, Texas, USA.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.