|ITEM METADATA RECORD
|Title: ||On the hot-hole induced post-stress interface trap generation in MOSFETs|
|Authors: ||Al-Kofahi, I. S ×|
Groeseneken, Guido #
|Issue Date: ||1996 |
|Host Document: ||pages:305-310|
|Conference: ||1996 International Reliability Physics Proceedings ; April 29 - May 2, 1996. Dallas, Texas, USA.|
|Publication status: ||published|
|KU Leuven publication type: ||IC|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
× corresponding author|
# (joint) last author|
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