Title: Characterization of ultra-thin PtSi films for infrared detectors
Authors: Bender, Hugo ×
Roussel, Philippe
Kolodinski, Sabine
Torres Jacome, Alfonso
Donaton, R. A
Maex, Karen
van der Sluis, P #
Issue Date: 1996
Host Document: pages:449-54
Conference: Silicide Thin Films - Fabrication, Properties, and Applications; 27-30 Nov. 1995; Boston, MA, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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