ITEM METADATA RECORD
Title: Accurate determination of channel length, series resistance and junction doping profile for MOSFET optimisation in deep submicron technologies
Authors: Biesemans, Serge ×
Hendriks, Marton
Kubicek, Stefan
De Meyer, Kristin #
Issue Date: 1996
Conference: VLSI Symposium 1996. Technical Digest; June 1996; Honolulu, Hawai,USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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