Title: A novel hot-hole injection degradation model for lateral nDMOS transistors
Authors: Moens, P ×
Tack, Marnix
Degraeve, Robin
Groeseneken, Guido #
Issue Date: 2001
Host Document: pages:877-880
Conference: IEDM Technical Digest; December 2001; Washington, D.C.
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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