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Title: Real time investigation of conduction mechanism with bias stress in silica-based intermetal dielectrics
Authors: Li, Yunlong ×
Groeseneken, Guido
Maex, Karen
Tokei, Zsolt #
Issue Date: 2007
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:7 issue:2 pages:252-258
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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