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Title: Negligible effect of process-induced strain on intrinsic NBTI behavior
Authors: Shickova, Adelina ×
Kaczer, Ben
Verheyen, Peter
Eneman, Geert
San Andres Serrano, Enrique
Jurczak, Malgorzata
Absil, Philippe
Maes, Herman
Groeseneken, Guido #
Issue Date: 2007
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Electron Device Letters vol:28 issue:3 pages:242-244
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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