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ITEM METADATA RECORD
Title: Process- and irradiation-induced defects in silicon devices
Authors: Claeys, Cor ×
Simoen, Eddy
Vanhellemont, Jan #
Issue Date: 1996
Series Title: Nuclear Instruments and Methods in Physics Research A vol:377 pages:244-257
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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