|ITEM METADATA RECORD
|Title: ||Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)|
|Authors: ||De Blauwe, Jan|
Van Houdt, Jan
|Issue Date: ||1996 |
|Conference: ||27th IEEE Semiconductor Interface Specialists Conference (SISC); December 5-7, 1996; San Diego, Calif., USA. location:Leuven Belgium|
|Publication status: ||published|
|KU Leuven publication type: ||DI|
|Appears in Collections:||ESAT - MICAS, Microelectronics and Sensors|
Associated Section of ESAT - INSYS, Integrated Systems
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