Title: Study of DC stress induced leakage current (SILC) and its dependence on oxide nitridation
Authors: De Blauwe, Jan ×
Degraeve, Robin
Bellens, Rudi
Van Houdt, Jan
Roussel, Philippe
Groeseneken, Guido
Maes, Herman #
Issue Date: 1996
Host Document: pages:361-364
Conference: ESSDERC '96: Proceedings of the 26th European Solid-State Device Research Conference; 9-11 September 1996; Bologna, Italy. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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