Title: A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
Authors: Degraeve, Robin ×
De Blauwe, Jan
Ogier, Jean-Luc
Roussel, Philippe
Groeseneken, Guido
Maes, Herman #
Issue Date: 1996
Host Document: pages:327-330
Conference: International Electron Devices Meeting. Technical Digest; 8-11 December 1996; San Francisco, CA, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

Files in This Item:

There are no files associated with this item.

Request a copy


All items in Lirias are protected by copyright, with all rights reserved.

© Web of science