Title: On the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
Authors: Degraeve, Robin ×
Ogier, Jean-Luc
Bellens, Rudi
Roussel, Philippe
Groeseneken, Guido
Maes, Herman #
Issue Date: 1996
Host Document: pages:44-54
Conference: Proceedings 1996 International Reliability Physics Symposium; April 29 - May 2, 1996; Dallas, TX, USA. location:Leuven Belgium
Publication status: published
KU Leuven publication type: IC
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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