Title: A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions
Authors: Degraeve, Robin ×
Roussel, Philippe
Ogier, Jean-Luc
Groeseneken, Guido
Maes, Herman #
Issue Date: 1996
Series Title: Microelectronics Reliability vol:36 pages:1651-1654
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:ESAT - MICAS, Microelectronics and Sensors
Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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