Title: Ultra-thin gate oxide breakdown
Authors: Depas, Michel ×
Heyns, Marc
Mertens, Paul #
Issue Date: 1996
Series Title: European Semiconductor vol:19 pages:45-46
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Clinical Residents Medicine
Surface and Interface Engineered Materials
× corresponding author
# (joint) last author

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