Title: Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study
Authors: Kaczer, Ben ×
Degraeve, Robin
Rasras, Mahmoud
De Keersgieter, An
Van de Mieroop, Koen
Groeseneken, Guido #
Issue Date: 2002
Series Title: Microelectronics Reliability vol:42 issue:04/05/07 pages:555-564
ISSN: 0026-2714
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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