Title: Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability
Authors: Kaczer, Ben ×
Degraeve, Robin
Rasras, Mahmoud
Van de Mieroop, Koen
Roussel, Philippe
Groeseneken, Guido #
Issue Date: 2002
Series Title: IEEE Transactions on Electron Devices vol:49 issue:3 pages:500-506
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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