Title: Evaluation of triple-gate FinFETs with SiO2-HfO2-TiN gate stack under analog operation
Authors: Pavanello, M.A ×
Martino, J.A
Simoen, Eddy
Rooyackers, Rita
Collaert, Nadine
Claeys, Corneel #
Issue Date: 2007
Series Title: Solid-State Electronics vol:51 issue:2 pages:285-291
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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