|ITEM METADATA RECORD
|Title: ||Evaluation of triple-gate FinFETs with SiO2-HfO2-TiN gate stack under analog operation|
|Authors: ||Pavanello, M.A ×|
Claeys, Corneel #
|Issue Date: ||2007 |
|Series Title: ||Solid-State Electronics vol:51 issue:2 pages:285-291|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
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