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Title: Low Weibull slope of breakdown distributions in high-K layers
Authors: Kauerauf, Thomas ×
Degraeve, Robin
Cartier, Eduard
Soens, Charlotte
Groeseneken, Guido #
Issue Date: 2002
Series Title: IEEE Electron Device Letters vol:23 issue:4 pages:215-217
ISSN: 0741-3106
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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