Title: Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures
Authors: Marchand, B ×
Cretu, B
Ghibaudo, G
Balestra, F
Blachier, D
Leroux, C
Deleonibus, S
Guegan, G
Reimbold, G
Kubicek, Stefan
De Meyer, Christina #
Issue Date: 2002
Series Title: Solid-State Electronics vol:46 issue:3 pages:337-342
ISSN: 0038-1101
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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