|ITEM METADATA RECORD
|Title: ||Secondary impact ionization and device aging in deep submicron MOS devices with various transistor architectures|
|Authors: ||Marchand, B ×|
De Meyer, Christina #
|Issue Date: ||2002 |
|Series Title: ||Solid-State Electronics vol:46 issue:3 pages:337-342|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Electrical Engineering - miscellaneous|
× corresponding author|
# (joint) last author|
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