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Title: Reduction of the anomalous VT behavior in MOSFETs with High-k/metal gate stacks
Authors: Ferain, Isabelle ×
Pantisano, Luigi
Kottantharayil, Anil
Petry, Jasmine
Trojman, Lionel
Collaert, Nadine
Jurczak, Malgorzata
De Meyer, Christina #
Issue Date: 2007
Series Title: Microelectronic Engineering vol:84 issue:09/10/07 pages:1882-1885
ISSN: 0167-9317
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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