Title: Origin of substrate hole current after gate oxide breakdown
Authors: Rasras, Mahmoud ×
De Wolf, Ingrid
Groeseneken, Guido
Degraeve, Robin
Maes, Herman #
Issue Date: 2002
Publisher: American Institute of Physics
Series Title: Journal of Applied Physics vol:91 issue:4 pages:2155-2160
ISSN: 0021-8979
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
Associated Section of ESAT - INSYS, Integrated Systems
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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