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Title: Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Authors: Papanikolaou, Antonis ×
Wang, Hua
Miranda Corbalan, Miguel
Catthoor, Francky #
Issue Date: Jul-2007
Host Document: pages:121-121
Conference: IEEE International On-Line Testing Symposium location:Leuven Belgium date:07/07/07
Publication status: published
KU Leuven publication type: IC
Appears in Collections:Electrical Engineering - miscellaneous
× corresponding author
# (joint) last author

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