Title: Effect of strain on mid-IR and LWIR lasers and detectors
Authors: Jain, Suresh
Van Hoof, Chris
Grietens, Bob
Nemeth, Stefan
Merken, Patrick
Borghs, Staf
Issue Date: 1996
Conference: International Conference on Semiconductor Materials and Technology; December 16-21, 1996; Delhi, India.
Publication status: published
KU Leuven publication type: DI
Appears in Collections:Electrical Engineering - miscellaneous

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