Title: Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics
Authors: Roussel, Philippe ×
Degraeve, Robin
Van den Bosch, G
Kaczer, Ben
Groeseneken, Guido #
Issue Date: 2001
Publisher: Institute of Electrical and Electronics Engineers
Series Title: IEEE Transactions on Device and Materials Reliability vol:1 issue:2 pages:120-127
ISSN: 1530-4388
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Electrical Engineering - miscellaneous
ESAT - MICAS, Microelectronics and Sensors
× corresponding author
# (joint) last author

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