|ITEM METADATA RECORD
|Title: ||Impact of CMOS processing steps on the drain current kink of NMOSFETS at liquid helium temperature|
|Authors: ||Simoen, Eddy ×|
Claeys, Corneel #
|Issue Date: ||2001 |
|Series Title: ||IEEE Transactions on Electron Devices vol:48 issue:6 pages:1207-1215|
|Publication status: ||published|
|KU Leuven publication type: ||IT|
|Appears in Collections:||Associated Section of ESAT - INSYS, Integrated Systems|
× corresponding author|
# (joint) last author|
|Files in This Item:
There are no files associated with this item.
Request a copy
All items in Lirias are protected by copyright, with all rights reserved.
© Web of science