Title: Impact of CMOS processing steps on the drain current kink of NMOSFETS at liquid helium temperature
Authors: Simoen, Eddy ×
Claeys, Corneel #
Issue Date: 2001
Series Title: IEEE Transactions on Electron Devices vol:48 issue:6 pages:1207-1215
ISSN: 0018-9383
Publication status: published
KU Leuven publication type: IT
Appears in Collections:Associated Section of ESAT - INSYS, Integrated Systems
× corresponding author
# (joint) last author

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